Tatarintsev Andrei Andreevich

Publications in Math-Net.Ru

1. Резистивные газовые сенсоры на основе полиен-полииновой структуры с внедренными наночастицами TiO$_2$
   
   Fizika Tverdogo Tela, 67:12 (2025),  2318–2330
2. Features of resistance, critical temperature and microstructure of cryogenic thin aluminum films
   
   Fizika Tverdogo Tela, 67:7 (2025),  1241–1246
3. Optimization of technologies for manufacturing integrated photonics structures using positive electron resist AR-P 6200
   
   Optics and Spectroscopy, 133:3 (2025),  292–298
4. Effect of internal charging on cathodoluminescence profiling capability: boron-implanted $\beta$-Ga$_2$O$_3$
   
   Optics and Spectroscopy, 133:3 (2025),  239–246
5. Morphology and electrical parameters of thin aluminum films deposited on substrates at temperatures from 77 to 800 K
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 51:4 (2025),  42–45
6. Thin aluminum films deposited on liquid nitrogen cooled substrates
   
   Fizika Tverdogo Tela, 66:7 (2024),  1038–1041
7. Evolution of composition and topography of A$^{\mathrm{III}}$B$^{\mathrm{V}}$ semiconductors during sputtering with argon ions
   
   Fizika i Tekhnika Poluprovodnikov, 58:12 (2024),  676–682
8. Electrization of the quartz glass surface by electron beams
   
   Fizika Tverdogo Tela, 65:8 (2023),  1288–1296
9. a-C : ND coatings obtained by plasma chemical deposition: interplay between field emission properties and phase composition
   
   Fizika Tverdogo Tela, 65:4 (2023),  656–668
10. Effect of electron beam energy on charging characteristics of polymer composites with the inclusion of carbon nanotubes
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 49:12 (2023),  34–38
11. Method for measuring the dielectrics charging potential under ion irradiation using shifting the bremsstrahlung edge
    
    Zhurnal Tekhnicheskoi Fiziki, 92:9 (2022),  1467–1470
12. Photoluminescence of sapphire irradiated by low-energy electrons and ions
    
    Optics and Spectroscopy, 130:9 (2022),  1372–1377
13. A new scenario for the kinetics of charging dielectrics under irradiation with medium-energy electrons
    
    Fizika Tverdogo Tela, 63:4 (2021),  483–498
14. Energy distributions of secondary charged particles sputtered by gas cluster ions
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:8 (2021),  25–28
15. Influence of the finite-size effect on the cluster ion emission of silicon nanostructures
    
    Pis'ma v Zh. Èksper. Teoret. Fiz., 111:8 (2020),  531–535
16. Charging of dielectrics under medium energy Ar$^{+}$ ions irradiation
    
    Fizika Tverdogo Tela, 61:6 (2019),  1090–1093
17. Charging of ion-implanted dielectrics by electron irradiation
    
    Zhurnal Tekhnicheskoi Fiziki, 89:8 (2019),  1276–1281
18. Electron-beam charging of dielectrics preirradiated with moderate-energy ions and electrons
    
    Fizika Tverdogo Tela, 59:8 (2017),  1504–1513
19. Determination of thickness of ultrathin surface films in nanostructures from the energy spectra of reflected electrons
    
    Zhurnal Tekhnicheskoi Fiziki, 85:10 (2015),  101–104


20. Influence of the homobuffer layer on the morphology, microstructure, and hardness of Al/Si(111) films
    
    Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  897–906