Publications in Math-Net.Ru
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Determination of plastic strain in heterostructures from X-ray diffractometric data
Fizika Tverdogo Tela, 31:9 (1989), 76–80
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X-ray diffraction study of distorted surface layers of $\mathrm{Si} (111)$ and $\mathrm{In}_{0.5}\mathrm{Ga}_{0.5}\mathrm{P}/\mathrm{GaAs} (111)$ basing on the constant strain gradient model
Fizika Tverdogo Tela, 31:4 (1989), 74–81
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Determination of the discrepancy and of the stresses in the
multilayer heterostructures of the $\mathrm{A}^\mathrm{III}\mathrm{B}^\mathrm{V}$ type
Dokl. Akad. Nauk SSSR, 292:2 (1987), 354–356
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X-ray bragg diffraction on crystals with transition layers
Fizika Tverdogo Tela, 26:5 (1984), 1319–1325
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EFFECT OF ELASTIC STRESS ON PARAMETERS OF THE X-RAY-DIFFRACTION SPECTRUM
FROM SUPERLATTICES
Zhurnal Tekhnicheskoi Fiziki, 54:4 (1984), 842–844
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