Malyshev Ilya Vyacheslavovich

Publications in Math-Net.Ru

1. Automated system for measuring the surface shape of large-size flat and cylindrical mirrors on a Fizeau interferometer
   
   Zhurnal Tekhnicheskoi Fiziki, 95:10 (2025),  1984–1994
2. Double-mirror monochromator for the 4+ generation “SKIF” synchrotron light source
   
   Zhurnal Tekhnicheskoi Fiziki, 95:10 (2025),  1963–1972
3. Kirkpatrick–Baez focusing system for synchrotron applications
   
   Zhurnal Tekhnicheskoi Fiziki, 95:10 (2025),  1954–1962
4. Multilayer NiMo/C structures fabricated by reactive magnetron sputtering
   
   Zhurnal Tekhnicheskoi Fiziki, 95:9 (2025),  1808–1816
5. Correlative extreme ultraviolet, ultraviolet and optical microscopy based on a specular microscope with axial tomography
   
   Zhurnal Tekhnicheskoi Fiziki, 94:8 (2024),  1302–1313
6. Ni-based multilayer structures for Goebel-type mirrors
   
   Zhurnal Tekhnicheskoi Fiziki, 94:8 (2024),  1280–1287
7. Investigations of Microscopic X-ray tomography
   
   Zhurnal Tekhnicheskoi Fiziki, 94:7 (2024),  992–1001
8. Substrates for soft X-ray microscopy based on Si$_3$N$_4$ membranes
   
   Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  1032–1036
9. Project of X-ray optical scheme of a lithograph with a transmissive dynamic mask and a synchrotron radiation source
   
   Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  980–987
10. Off-axis aspherical collector for EUV-lithography and SXR microscopy
    
    Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  963–967
11. The theory of axial tomography based on the inverse Radon transform for high-aperture soft X-ray microscopy
    
    Zhurnal Tekhnicheskoi Fiziki, 93:7 (2023),  867–879
12. Project of a two-mirror monochromator for the photon energy range 8–36 keV for the “SKIF” synchrotron
    
    Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1261–1266
13. Imaging system of a plasma torch of a Betatron X-ray source
    
    Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1202–1206
14. Search for high-strength multilayer free-standing film filters with high transmittance in the wavelength range of the “water window” (2.3–4.4 nm)
    
    Zhurnal Tekhnicheskoi Fiziki, 92:8 (2022),  1130–1136
15. Wavefront lens corrector for studying flat surfaces
    
    Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021),  1583–1587
16. Ion-beam methods for high-precision processing of optical surfaces
    
    Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1922–1930
17. Multilayer Cr/Sc mirrors with improved reflection for the “water transparency window” range
    
    Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1893–1897
18. Features of multilayer mirror application for focusing and collimating X-rays from inverse Compton scattering sources
    
    Kvantovaya Elektronika, 50:4 (2020),  401–407
19. Diffraction limited X-ray optics: technology, metrology, applications
    
    UFN, 190:1 (2020),  74–91
20. Measurement error of interferometers with diffraction reference wave
    
    Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019),  1789–1794
21. Beryllium as a material for thermally stable X-ray mirrors
    
    Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019),  1686–1691
22. Simulation of local error correction of the surface shape by a low-dimensional ion beam
    
    Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019),  1650–1655