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Publications in Math-Net.Ru
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ELECTRON-OPTICAL PROPERTIES OF ELECTROSTATIC SPHERICAL MIRROR AND BASED
ON IT SYSTEMS
Zhurnal Tekhnicheskoi Fiziki, 62:6 (1992), 189–204
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DISPERSION OF ENERGY-CHARGED PARTICLES BEAMS DURING RETARDATION IN
2-DIMENSIONAL ELECTROSTATIC-FIELD OF X1/N-TYPE
Zhurnal Tekhnicheskoi Fiziki, 62:3 (1992), 212–214
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LINEARIZATION OF FOCUS LINES IN MIRRORS WITH ELECTROSTATIC 2-DIMENSIONAL
FIELDS
Zhurnal Tekhnicheskoi Fiziki, 61:10 (1991), 8–18
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AXISYMMETRICAL ELECTROSTATIC MULTIPOLES - THEIR APPLICATION
Zhurnal Tekhnicheskoi Fiziki, 61:4 (1991), 148–157
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SPHERIC MIRROR ANALYZER OF CHARGED-PARTICLE BEAMS
Pisma v Zhurnal Tekhnicheskoi Fiziki, 17:21 (1991), 1–3
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ELECTROSTATIC ANALYZER WITH ENERGY-ANGULAR RESOLUTION FOR SPECTROMETRY
Zhurnal Tekhnicheskoi Fiziki, 60:4 (1990), 201–202
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STRAIGHTENING OUT THE FOCUS LINE IN THE MULTISTAGE SYSTEM OF
ELECTROSTATIC CYLINDRICAL MIRRORS
Zhurnal Tekhnicheskoi Fiziki, 59:11 (1989), 56–63
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ELECTRONIC-OPTICAL PROPERTIES OF ELECTROSTATIC SPHERICAL MIRRORS AND
SYSTEMS BASED ON THEM .2. ELECTROSTATIC SPHERICAL MIRROR IN THE MODE OF
EXTERNAL REFLECTION OF CHARDED PARTICLE BEAMS
Zhurnal Tekhnicheskoi Fiziki, 59:7 (1989), 1–9
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REGIME OF SPECTROGRAPH IN ENERGY ANALYZER WITH 2 CYLINDRICAL MIRRORS
Zhurnal Tekhnicheskoi Fiziki, 58:10 (1988), 2021–2025
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ELECTRON-OPTICAL PROPERTIES OF ELECTROSTATIC SPHERICAL MIRROR AND SYSTEM
BASED ON IT .1.
Zhurnal Tekhnicheskoi Fiziki, 58:10 (1988), 2010–2020
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EMITTER LINE RECTIFICATION IN A CYLINDRICAL MIRROR ENERGY ANALYZER
Zhurnal Tekhnicheskoi Fiziki, 56:2 (1986), 372–378
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TYPE OF BEAM FOCUSING OF CHARGED-PARTICLES IN ELECTROSTATIC SPHERICAL
MIRRORS
Zhurnal Tekhnicheskoi Fiziki, 54:4 (1984), 704–710
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ENERGY MASS-ANALYZER ON THE BASIS OF 2 FLAT CONDENSERS
Zhurnal Tekhnicheskoi Fiziki, 53:2 (1983), 361–364
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Auger electron spectra of some rare-earth metals
Dokl. Akad. Nauk SSSR, 204:4 (1972), 828–830
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