Argunova Tatiana S

Publications in Math-Net.Ru

1. Dislocation structure of bulk AlN crystals under indentation
   
   Fizika i Tekhnika Poluprovodnikov, 59:5 (2025),  306–309
2. Measurement of step heights on a crystal surface using synchrotron phase contrast imaging
   
   Fizika Tverdogo Tela, 66:12 (2024),  2201–2204
3. Section methods of X-ray diffraction topography
   
   Zhurnal Tekhnicheskoi Fiziki, 92:10 (2022),  1475–1496
4. A new method for synchrotron radiation X-ray imaging of micro-objects using nanofocusing optics and tomography
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 48:19 (2022),  31–34
5. Study of dentin structural features by computed microtomography and transmission electron microscopy
   
   Zhurnal Tekhnicheskoi Fiziki, 90:9 (2020),  1449–1461
6. A model of microcrack development in human tooth dentin using data of microtomography
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:10 (2020),  46–50
7. Study of micropores in single crystals by in-line phase contrast imaging with synchrotron radiation
   
   UFN, 189:6 (2019),  643–658
8. Prevention of AlN crystal from cracking on SiC substrates by evaporation of the substrates
   
   Fizika Tverdogo Tela, 57:12 (2015),  2400–2404
9. Mechanisms of the formation of morphological features of micropipes in bulk crystals of silicon carbide
   
   Fizika Tverdogo Tela, 57:4 (2015),  733–740
10. Reverse recovery of Si/Si$_{1-x}$Ge$_x$ heterodiodes fabricated by direct bonding
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 37:13 (2011),  83–89
11. Structural and electrical properties of SiGe-on-insulator substrates fabricated by direct bonding
    
    Fizika i Tekhnika Poluprovodnikov, 44:8 (2010),  1135–1139
12. Structural perfection of $\mathrm{InAs}_{1-x-y}\mathrm{Sb}_{x}\mathrm{P}_{y}$–$\mathrm{InAs}$ double heterostructures
    
    Fizika Tverdogo Tela, 32:11 (1990),  3355–3361
13. Misfit stress relaxation in $\mathrm{In}_{1-x}\mathrm{Ga}_{x}\mathrm{As}_{1-y}\mathrm{Sb}_{y}/\mathrm{GaSb}(x\sim 0.1,y\sim 0.2)$ heterostructures
    
    Fizika Tverdogo Tela, 31:8 (1989),  158–163
14. Effect of misfit dislocations on the Bragg X-ray diffraction in heterostructures
    
    Fizika Tverdogo Tela, 31:1 (1989),  40–45
15. ANOMALOUS OBSERVABILITY OF THE X-RAY TOPOGRAPHIC CONTRAST OF DISLOCATION LATTICES OF NONCOMFORMITY IN HETEROEPITAXIAL STRUCTURES
    
    Zhurnal Tekhnicheskoi Fiziki, 57:6 (1987),  1114–1120
16. DEFECT FORMATION IN GAALSB/GASB STRUCTURES FOR PHOTODIODES
    
    Zhurnal Tekhnicheskoi Fiziki, 57:2 (1987),  316–321
17. Dislocation-structure and volt-ampere characteristics of diode smooth $n-In\,As/p-In\,As_{1-x}\,P_{x}$ heterosystems, obtained by the electric liquid epitaxy method
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 13:18 (1987),  1134–1139
18. X-ray topography determination of misfit dislocation sign
    
    Fizika Tverdogo Tela, 28:4 (1986),  1052–1057
19. Anomalous visibility of misfit dislocations on X-ray topograms in Bragg geometry
    
    Fizika Tverdogo Tela, 28:2 (1986),  581–583
20. Misfit $60^{\circ}$-degree-dislocations in $\mathrm{In}_{x}\mathrm{Ga}_{1-x}\mathrm{As}/\mathrm{GaAs} (001)$ type heterostructures
    
    Fizika Tverdogo Tela, 27:10 (1985),  2960–2964
21. DISLOCATION DENSITY AND P-N STRUCTURE PARAMETERS BASED ON GAAS(1-X)SBX SOLID-SOLUTIONS
    
    Zhurnal Tekhnicheskoi Fiziki, 55:11 (1985),  2280–2282