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Petrović Srdjan M

Publications in Math-Net.Ru

  1. Influence of the charge state of xenon ions on the depth distribution profile upon implantation into silicon

    Fizika i Tekhnika Poluprovodnikov, 53:8 (2019),  1030–1036
  2. Deflection of 100 MeV positron beam by repeated reflections in thin crystals

    Pis'ma v Zh. Èksper. Teoret. Fiz., 98:11 (2013),  739–742


© Steklov Math. Inst. of RAS, 2026