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Publications in Math-Net.Ru
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Polarization processes in thin layers of glassy hybrid system Ge$_{28.5}$Pb$_{14.0}$Fe$_{1.0}$S$_{56.5}$
Fizika i Tekhnika Poluprovodnikov, 56:6 (2022), 559–565
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Study of relaxers distribution in thin layers of amorphous MoTe$_{2}$
Fizika Tverdogo Tela, 63:11 (2021), 1852–1855
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Charge transfer in thin layers of glassy Ge$_{28.5}$Pb$_{14.5}$Fe$_{0.5}$S$_{56.5}$
Fizika i Tekhnika Poluprovodnikov, 55:5 (2021), 450–454
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Polarization processes in thin layers of amorphous MoS$_2$ obtained by RF magnetron sputtering
Fizika i Tekhnika Poluprovodnikov, 54:5 (2020), 461–465
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Structural and dielectric study of thin amorphous layers of the Ge–Sb–Te system prepared by RF magnetron sputtering
Fizika i Tekhnika Poluprovodnikov, 54:2 (2020), 149–152
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Low-frequency dielectric relaxation in glassy system Ge$_{28.5}$Pb$_{15}$S$_{56.5}$ with iron impurity
Meždunar. nauč.-issled. žurn., 2018, no. 3(69), 15–18
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Dielectric relaxation in thin layers of the Ge$_{28.5}$Ðb$_{15}$S$_{56.5}$ glassy system
Fizika i Tekhnika Poluprovodnikov, 52:8 (2018), 912–915
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Current spectroscopy of defect states in As-Se glassy system
Meždunar. nauč.-issled. žurn., 2017, no. 5-3(59), 147–153
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Ultralow-frequency photoelectric response of amorphous As$_2$Se$_3$ layers
Fizika i Tekhnika Poluprovodnikov, 47:7 (2013), 944–947
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Study of the structure of $a$-As$_2$Se$_3\langle$Bi$\rangle_x$ amorphous layers by dielectric spectroscopy
Fizika i Tekhnika Poluprovodnikov, 47:1 (2013), 92–96
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Specific features of the photodielectric effect in amorphous $\alpha$-As$_2$Se$_3$ layers
Pisma v Zhurnal Tekhnicheskoi Fiziki, 39:2 (2013), 1–6
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Effect of bismuth dopant on the dielectric properties of modified As$_2$Se$_3$
Fizika Tverdogo Tela, 53:3 (2011), 430–432
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Features of the charge transfer in structures based on thin layers of bismuth-modified arsenic triselenide
Fizika i Tekhnika Poluprovodnikov, 44:8 (2010), 1038–1041
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