Svechnikov Mikhail Vladimirovich

Publications in Math-Net.Ru

1. Application of cerium oxide nanopowders for silicon polishing
   
   Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021),  1588–1596
2. Manufacturing and research of mirrors with a wide bandwidth for synchrotron applications
   
   Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021),  1524–1531
3. High-precision characterization of super-multiperiod AlGaAs/GaAs superlattices using X-ray reflectometry on a synchrotron source
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 47:15 (2021),  7–10
4. Deep X-ray reflectometry of supermultiperiod A$_3$B$_5$ structures with quantum wells grown by molecular-beam epitaxy
   
   Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1906–1912
5. Multilayer Cr/Sc mirrors with improved reflection for the “water transparency window” range
   
   Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1893–1897
6. Broadband mirrors for spectroheliographs at the KORTES sun study facility
   
   Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1876–1883
7. The smoothing effect of si layers in multilayer Be/Al mirrors for the 17- to 31-nm range
   
   Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020),  1870–1875
8. Features of multilayer mirror application for focusing and collimating X-rays from inverse Compton scattering sources
   
   Kvantovaya Elektronika, 50:4 (2020),  401–407
9. Influence of thermal annealing on the properties of multilayer Mo/Be mirrors
   
   Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019),  1783–1788
10. Influence of beryllium barrier layers on the properties of Mo/Si multilayer mirrors
    
    Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019),  1779–1782
11. Optimization of composition, synthesis, and study of broadband multilayer mirrors for the EUV spectral range
    
    Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019),  1763–1769
12. Stable multilayer reflective coatings for $\lambda$(HeI) = 58.4 nm for the kortes solar telescope
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:3 (2019),  26–29
13. Comparison of approaches in the manufacture of broadband mirrors for the EUV range: aperiodic and stack structures
    
    Kvantovaya Elektronika, 49:4 (2019),  380–385
14. Laboratory reflectometer for the investigation of optical elements in a wavelength range of 5 – 50 nm: description and testing results
    
    Kvantovaya Elektronika, 47:4 (2017),  385–392


15. Beryllium-based multilayer X-ray optics
    
    UFN, 190:1 (2020),  92–106