Publications in Math-Net.Ru
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Investigation of the filament properties in the HfO$_2$-based structures using conductive atomic force microscopy
Zhurnal Tekhnicheskoi Fiziki, 93:8 (2023), 1143–1151
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Low resistance state degradation during endurance measurements in HfO$_2$(8 םל)/HfO$_X$N$_Y$-based structures
Fizika i Tekhnika Poluprovodnikov, 57:6 (2023), 451–454
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Nanophotonic structure formation by dry e-beam etching of the resist: resolution limitation origins
Computer Optics, 41:4 (2017), 499–503
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Some peculiarities of a new method of microrelief creation by the direct electron-beam etching of resist
Computer Optics, 39:2 (2015), 204–210
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Formation of W/HfO$_2$/Si gate structures using in situ magnetron sputtering and rapid thermal annealing
Zhurnal Tekhnicheskoi Fiziki, 84:5 (2014), 82–87
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