Rau Eduard Ivanovich

Publications in Math-Net.Ru

1. Effect of increasing the coefficient of backscattered electrons for multilayer nanostructures and image contrast inversion in scanning electron microscopy
   
   UFN, 195:4 (2025),  425–431
2. Electrization of the quartz glass surface by electron beams
   
   Fizika Tverdogo Tela, 65:8 (2023),  1288–1296
3. Determination of the thicknesses and depths of subsurface nanostructures using a scanning electron microscope
   
   Pisma v Zhurnal Tekhnicheskoi Fiziki, 48:23 (2022),  22–25
4. A new scenario for the kinetics of charging dielectrics under irradiation with medium-energy electrons
   
   Fizika Tverdogo Tela, 63:4 (2021),  483–498
5. Charging of dielectrics under medium energy Ar$^{+}$ ions irradiation
   
   Fizika Tverdogo Tela, 61:6 (2019),  1090–1093
6. Charging of ion-implanted dielectrics by electron irradiation
   
   Zhurnal Tekhnicheskoi Fiziki, 89:8 (2019),  1276–1281
7. Electron-beam charging of dielectrics preirradiated with moderate-energy ions and electrons
   
   Fizika Tverdogo Tela, 59:8 (2017),  1504–1513
8. Determination of thickness of ultrathin surface films in nanostructures from the energy spectra of reflected electrons
   
   Zhurnal Tekhnicheskoi Fiziki, 85:10 (2015),  101–104
9. Updating of the toroidal electron spectrometer intended for a scanning electron microscope and its new applications in diagnostics of micro- and nanoelectronic structures
   
   Zhurnal Tekhnicheskoi Fiziki, 83:3 (2013),  140–147
10. Response function and optimum configuration of semiconductor backscattered-electron detectors for scanning electron microscopes
    
    Fizika i Tekhnika Poluprovodnikov, 46:6 (2012),  829–832
11. Solution of the inverse problem of restoring the signals from an electronic microscope in the backscattered electron mode on the class of bounded variation functions
    
    Num. Meth. Prog., 12:3 (2011),  362–367
12. Microtomography of semiconductor structure in the regime of induced current
    
    Dokl. Akad. Nauk SSSR, 307:4 (1989),  840–844
13. Semiconductor structure investigation by the methods of acoustic and electron thermoacoustic microscopy
    
    Dokl. Akad. Nauk SSSR, 301:4 (1988),  849–851
14. Microtomography of layered media in conical beams
    
    Dokl. Akad. Nauk SSSR, 296:5 (1987),  1095–1097
15. Computing tomography of objects in X-ray and optical scanning microscopy
    
    Dokl. Akad. Nauk SSSR, 289:5 (1986),  1104–1107
16. Temperature Dependence of Induced Current and Local Spectroscopy of Impurity Levels by Scanning Electron Microscopy Methods
    
    Fizika i Tekhnika Poluprovodnikov, 20:4 (1986),  607–612
17. Observation of intraphase boundaries in ceramic $Sb\,Si$ represented by thermowaves
    
    Pisma v Zhurnal Tekhnicheskoi Fiziki, 11:16 (1985),  983–986
18. Color-coded display of information in scanning electron microscopy
    
    UFN, 139:1 (1983),  165–168