Orlikovsky Nikolai Aleksandrovich

Publications in Math-Net.Ru

1. Method for measuring the dielectrics charging potential under ion irradiation using shifting the bremsstrahlung edge
   
   Zhurnal Tekhnicheskoi Fiziki, 92:9 (2022),  1467–1470
2. Determination of thickness of ultrathin surface films in nanostructures from the energy spectra of reflected electrons
   
   Zhurnal Tekhnicheskoi Fiziki, 85:10 (2015),  101–104
3. Updating of the toroidal electron spectrometer intended for a scanning electron microscope and its new applications in diagnostics of micro- and nanoelectronic structures
   
   Zhurnal Tekhnicheskoi Fiziki, 83:3 (2013),  140–147
4. Response function and optimum configuration of semiconductor backscattered-electron detectors for scanning electron microscopes
   
   Fizika i Tekhnika Poluprovodnikov, 46:6 (2012),  829–832
5. Solution of the inverse problem of restoring the signals from an electronic microscope in the backscattered electron mode on the class of bounded variation functions
   
   Num. Meth. Prog., 12:3 (2011),  362–367