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Publications in Math-Net.Ru
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Measurement of step heights on a crystal surface using synchrotron phase contrast imaging
Fizika Tverdogo Tela, 66:12 (2024), 2201–2204
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A new method for synchrotron radiation X-ray imaging of micro-objects using nanofocusing optics and tomography
Pisma v Zhurnal Tekhnicheskoi Fiziki, 48:19 (2022), 31–34
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Study of micropores in single crystals by in-line phase contrast imaging with synchrotron radiation
UFN, 189:6 (2019), 643–658
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Mechanisms of the formation of morphological features of micropipes in bulk crystals of silicon carbide
Fizika Tverdogo Tela, 57:4 (2015), 733–740
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On the theory of X-ray refractive optics: Exact solution for a parabolic medium
Pis'ma v Zh. Èksper. Teoret. Fiz., 76:10 (2002), 701–704
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Структурная чувствительность кривых фотоэдс в условиях образования
стоячей рентгеновской волны в полупроводнике с $p{-}n$-переходом
Fizika i Tekhnika Poluprovodnikov, 23:6 (1989), 1054–1057
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DETERMINATION OF CRYSTALLOGRAPHIC POLARITY OF CDTE BY THE STANDING X-RAY
WAVE METHOD
Pisma v Zhurnal Tekhnicheskoi Fiziki, 15:22 (1989), 31–35
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STUDY OF THE STRUCTURE OF INDIVIDUAL LATTICES IN MULTICOMPONENT
EPITAXIAL IN0.5GA0.5P/GAAS FILMS BY THE STATIONARY X-RAY WAVE METHOD
Pisma v Zhurnal Tekhnicheskoi Fiziki, 14:15 (1988), 1345–1349
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Localization of impure atoms in the monocrystal content by the standing x-ray wave method in the Laue geometry
Pisma v Zhurnal Tekhnicheskoi Fiziki, 13:16 (1987), 982–986
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The problem of electron transport in the analysis of photoemission data from standing X-ray wave experiments
Fizika Tverdogo Tela, 28:11 (1986), 3409–3416
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Angular dependence of secondary emission under multiwave X-ray diffraction
Fizika Tverdogo Tela, 28:10 (1986), 3028–3036
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X-ray standing waves–a new method of studying the structure of crystals
UFN, 149:1 (1986), 69–103
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Small deformation measurement in thin epitaxial $\mathrm{si}$ films with photoelectron emission excited by standing X-ray wave
Fizika Tverdogo Tela, 27:11 (1985), 3379–3387
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