Abstract:
A new computational approach is developed to evaluate the strength of the error self-compensation effect in the case of broadband optical monitoring of the multilayer coating deposition process. A new form of estimating the strength of the error self-compensation effect is suggested. Computational experiments simulating the deposition process are used to study the presence of the self-compensation effect and it is shown that the assessment of two parameters characterizing the degree of error correlation and the strength of the self-compensation effect is sufficient from a practical point of view.