System Analysis, Control and Data Processing

On dominant connections in assessing the reliability of two-terminal networks

A. S. Losev

Institute of Applied Mathematics FEB RAS, Vladivostok

Abstract: The paper studies the problem of increasing the lifetime of a low-reliability two-terminal network through the influence on individual edges, called dominant. It is proved that the numerical characteristics of such edges form an asymptotic estimate of the lifetime of the entire two-terminal network, and changing their parameters and redundancy leads to a maximum increase in the reliability of the two-terminal network compared to other edges. The results of numerical experiments for calculating the reliability of a universal equivalent circuit of a transformer are presented.

Keywords: reliability, two-terminal network, dominant connections, Weibull distribution.

UDC: 519.178

Received: 21.07.2025
Revised: 02.10.2025
Accepted: 08.12.2025

DOI: 10.26456/vtpmk751

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