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Easily tested circuits for linear functions

S. R. Bedzhanova

Lomonosov Moscow State University, Faculty of Mechanics and Mathematics

Abstract: It is shown that a linear Boolean function of $n$ variables can be realized over the basis $\{\&,\vee,\;\bar{ }\;\}$ by an unzedundant circuit admitting a unit diagnostic test of the length $]\log (n-1)[ \;+2$ for inverse output errors of elements.

Key words: logic circuit, inverse-type output errors, diagnostic tests, test length.

UDC: 519.718

Received: 03.12.2010

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