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JOURNALS // Vestnik Moskovskogo Universiteta. Seriya 1. Matematika. Mekhanika // Archive

Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2015 Number 4, Pages 49–51 (Mi vmumm252)

This article is cited in 13 papers

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Lower estimate of the length of the complete test in the basis $\{x|y\}$

Yu. V. Borodina

Keldysh Institute of Applied Mathematics, Moscow

Abstract: It is proved that the length of the complete test is no less than $n+1$ ($n\ge 2$) for any circuit realizing the function $x_1\vee x_2\vee \ldots \vee x_n$ in the “ Sheffer stroke” basis with possible constant faults of type “1”. An example of such circuit is constructed so that the length of the complete test is exactly $n+1$.

Key words: curcuits of functional elements, constant faults, complete tests.

UDC: 519.718.7

Received: 27.06.2014


 English version:
Moscow University Mathematics Bulletin, Moscow University Mеchanics Bulletin, 2015, 70:4, 185–186

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