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JOURNALS // Uspekhi Fizicheskikh Nauk // Archive

UFN, 1987 Volume 152, Number 2, Pages 357–358 (Mi ufn7971)

This article is cited in 2 papers

BIBLIOGRAPHY

Scanning electron microscopy

V. G. Dyukov


Abstract: L. Reimer. Scanning Electron Microscopy: Physics of Image Formation and Microanalysis. Springer-Verlag, Berlin; Heidelberg; New York; Tokyo, 1985, pp. 457 (Springer Series in Optical Sciences. V. 45).

UDC: 337.533.35(049.3)

PACS: 68.37.Hk

DOI: 10.3367/UFNr.0152.198706q.0357


 English version:
Physics–Uspekhi, 1987, 30:6, 552


© Steklov Math. Inst. of RAS, 2026