RUS
ENG
Full version
JOURNALS
// Uspekhi Fizicheskikh Nauk
// Archive
UFN,
1987
Volume 152,
Number 2,
Pages
357–358
(Mi ufn7971)
This article is cited in
2
papers
BIBLIOGRAPHY
Scanning electron microscopy
V. G. Dyukov
Abstract:
L. Reimer. Scanning Electron Microscopy: Physics of Image Formation and Microanalysis. Springer-Verlag, Berlin; Heidelberg; New York; Tokyo, 1985, pp. 457 (Springer Series in Optical Sciences. V. 45).
UDC:
337.533.35(049.3)
PACS:
68.37.Hk
DOI:
10.3367/UFNr.0152.198706q.0357
Fulltext:
PDF file (45 kB)
Cited by
English version:
Physics–Uspekhi, 1987,
30
:6,
552
©
Steklov Math. Inst. of RAS
, 2026