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JOURNALS // Uspekhi Fizicheskikh Nauk // Archive

UFN, 2020 Volume 190, Number 1, Pages 2–36 (Mi ufn6362)

This article is cited in 43 papers

REVIEWS OF TOPICAL PROBLEMS

X-ray diffraction methods for structural diagnostics of materials: progress and achievements

G. V. Fetisov

Lomonosov Moscow State University, Faculty of Chemistry

Abstract: The development of X-ray diffractometry at the turn of the 21st century is presented. The review covers instrumentation development for structural studies based on the use of both standard continuously radiating X-ray generators and state-of-the-art sources of ultrashort and ultra-bright X-ray pulses. The latter technique enables investigation of the structural dynamics of condensed matter in a 4D space–time continuum with a resolution reaching a tenth of a femtosecond. New engineering approaches to enhancing the sensitivity, accuracy, and efficiency of X-ray diffraction experiments are discussed, including new and promising X-rays sources, reflective collimating and focusing X-ray optical devices, and fast low-noise and radiation-resistant position-sensitive X-ray detectors, as well as a new generation of X-ray diffractometers developed based on these elements. The presentation is focused on modern engineering solutions that enable academic and applied-research laboratories to perform X-ray diffraction studies on-site, which earlier were only feasible using synchrotron radiation sources at international resource sharing centers.

Keywords: X-ray diffraction, synchrotron radiation, X-ray diffractometers, pulse X-ray sources, laser-plasma X-ray sources, alternative X-ray sources, X-ray free-electron lasers, reflective X-ray optics, multilayer thin-film X-ray reflectors, semiconductor position-sensitive X-ray detectors, two-dimensional hybrid pixel detectors.

PACS: 07.85.-m, 42.55.Vc, 61.05.C-

Received: August 10, 2018
Revised: September 15, 2018
Accepted: October 4, 2018

DOI: 10.3367/UFNr.2018.10.038435


 English version:
Physics–Uspekhi, 2020, 63:1, 2–32

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