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JOURNALS // Uspekhi Fizicheskikh Nauk // Archive

UFN, 2008 Volume 178, Number 5, Pages 459–480 (Mi ufn594)

This article is cited in 260 papers

REVIEWS OF TOPICAL PROBLEMS

GaAs epitaxy on Si substrates: modern status of research and engineering

Yu. B. Bolkhovityanov, O. P. Pchelyakov

Institute of Semiconductor Physics, Siberian Branch of the Russian Academy of Sciences

Abstract: While silicon and gallium arsenide are dominant materials in modern micro- and nanoelectronics, devices fabricated from them still use Si and GaAs substrates only separately. Integrating these materials on the (highest effeciency) substrate of Si has been the subject of much research effort for more than twenty years. This review systematizes and generalizes the current understanding of the fundamental physical mechanisms governing the epitaxial growth of GaAs and its related III–V compounds on Si substrates. Basic techniques avilable for improving the quality of such heterostructures are described, and recent advances in fabricating device-quality A$^{\mathrm{III}}$B$^{\mathrm{V}}$/Si heterostructures and devices on their bases are also presented.

PACS: 61.72.Lk, 62.25.-g, 81.05.Cy, 81.05.Ea, 81.15.-z, 85.40.Sz

Received: November 28, 2007
Revised: January 9, 2008

DOI: 10.3367/UFNr.0178.200805b.0459


 English version:
Physics–Uspekhi, 2008, 51:5, 437–456

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