RUS  ENG
Full version
JOURNALS // Uspekhi Fizicheskikh Nauk // Archive

UFN, 2017 Volume 187, Number 2, Pages 201–219 (Mi ufn5668)

This article is cited in 16 papers

INSTRUMENTS AND METHODS OF INVESTIGATION

X-ray microscopy

V. V. Lider

Federal Scientific Research Center "Crystallography and Photonics", Russian Academy of Sciences, Shubnikov Institute of Crystallography, Moscow

Abstract: X-ray microscopy is a technique for obtaining real-space two- or three-dimensional images of an object using elements of the focusing optics. In this paper, various types of microscopes are reviewed and their applicability is examined; methods for obtaining image contrast are discussed, and avenues for the further development of X-ray microscopy are outlined.

Keywords: X-rays, X-ray optics, microscopy, spectroscopy, topography, fluorescence, magnetic dichroism.

PACS: 07.85.Tt, 41.50.+h

Received: April 25, 2016
Revised: May 30, 2016
Accepted: June 9, 2016

DOI: 10.3367/UFNr.2016.06.037830


 English version:
Physics–Uspekhi, 2017, 60:2, 187–203

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2026