RUS
ENG
Full version
JOURNALS
// Uspekhi Fizicheskikh Nauk
// Archive
UFN,
1965
Volume 86,
Number 1,
Pages
175–179
(Mi ufn11816)
This article is cited in
18
papers
FROM THE CURRENT LITERATURE
Thin-film electron interferometers
L. V. Iogansen
UDC:
539.124
PACS:
85.30.Mn
,
73.50.-h
,
73.40.Gk
,
84.47.+w
DOI:
10.3367/UFNr.0086.196505f.0175
Fulltext:
PDF file (410 kB)
Cited by
English version:
Physics–Uspekhi, 1965,
8
:3,
413–416
©
Steklov Math. Inst. of RAS
, 2026
Fulltext:
PDF file (410 kB)