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JOURNALS
// Uspekhi Fizicheskikh Nauk
// Archive
UFN,
1996
Volume 166,
Number 2,
Pages
210–213
(Mi ufn1160)
This article is cited in
1
paper
CONFERENCES AND SYMPOSIA
Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams
A. A. Bukharaev
Zavoisky Physical Technical Institute, Kazan Scientific Center of the Russian Academy of Sciences
PACS:
07.79.Cz
,
07.79.Lh
, 42.62.Hk
DOI:
10.3367/UFNr.0166.199602i.0210
Fulltext:
PDF file (1017 kB)
Cited by
English version:
Physics–Uspekhi, 1996,
39
:2,
193–196
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, 2026