RUS  ENG
Full version
JOURNALS // Uspekhi Fizicheskikh Nauk // Archive

UFN, 1996 Volume 166, Number 2, Pages 210–213 (Mi ufn1160)

This article is cited in 1 paper

CONFERENCES AND SYMPOSIA

Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams

A. A. Bukharaev

Zavoisky Physical Technical Institute, Kazan Scientific Center of the Russian Academy of Sciences

PACS: 07.79.Cz, 07.79.Lh, 42.62.Hk

DOI: 10.3367/UFNr.0166.199602i.0210


 English version:
Physics–Uspekhi, 1996, 39:2, 193–196

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2026