B. T. Boyko, V. M. Bratsikhin, A. T. Pugachev, “Electron-diffraction determination of the integrated emissivity of thin films”, TVT, 1971, Volume 9, Issue 3,Pages <nobr>652

JOURNALS // Teplofizika vysokikh temperatur // Archive

TVT, 1971 Volume 9, Issue 3, Pages 652–654 (Mi tvt10428)

Short Communications

Electron-diffraction determination of the integrated emissivity of thin films

B. T. Boyko, V. M. Bratsikhin, A. T. Pugachev

Khar'kov Polytechnical Institute

UDC: 535.231.6

Received: 18.07.1970

English version: High Temperature, 1971, 9:3, 600–602