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JOURNALS // Uspekhi Khimii // Archive

Usp. Khim., 2006 Volume 75, Issue 1, Pages 27–35 (Mi rcr322)

This article is cited in 13 papers

Atomic resolution probe microscopy of the graphite surface

O. V. Sinitsynaa, I. V. Yaminskiib

a Lomonosov Moscow State University, Faculty of Materials Science
b Lomonosov Moscow State University, Faculty of Physics

Abstract: The results of theoretical and experimental studies of the graphite surface by scanning tunnelling and atomic force microscopy are considered. The attention is focused on the mechanisms of formation of atomic resolution images. The reasons for the lack of coincidence between the graphite surface images obtained by these methods and its real topography are discussed.

Received: 29.08.2005

DOI: 10.1070/RC2006v075n01ABEH003600


 English version:
Russian Chemical Reviews, 2006, 75:1, 23–30

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© Steklov Math. Inst. of RAS, 2026