This article is cited in 46 papers

Scanning tunnelling and atomic force microscopy in the electrochemistry of surfaces

A. I. Danilov

Institute of Physical Chemistry, Russian Academy of Sciences, Moscow

Abstract: The theoretical foundations, principle of operation, constructional features, and the latest advances in scanning tunnelling and atomic force microscopy in situ are examined in relation to electrochemical studies on the surfaces of metallic electrodes, and adsorption, and electrocrystallisation processes. The bibliography includes 172 references.

UDC: 541.138

Received: 14.03.1995

DOI: 10.1070/RC1995v064n08ABEH000174

 English version: Russian Chemical Reviews, 1995, 64:8, 767–781

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