This article is cited in 9 papers

High-temperature X-ray diffraction: experience in the use of samples on a backing plate for studying crystalline phases mixed with the liquid

S. K. Filatov

Saint Petersburg State University

Abstract: This review covers the operating procedures for X-ray diffraction studies of materials and processes in the presence of the liquid phase over a wide range of temperatures using standard X-ray diffractometers with a polycrystalline sample on a backing plate. The feasibility of using high-temperature X-ray diffraction to study materials during melting and crystallisation, to construct the supersolidus parts of equilibrium diagrams of systems, to investigate fluid crystalline materials, to find the optimum conditions for preparing materials from a solution in the melt, etc. is demonstrated. The bibliography includes 14 references.

UDC: 548.3

Received: 13.12.1991

DOI: 10.1070/RC1992v061n11ABEH001018

 English version: Russian Chemical Reviews, 1992, 61:11, 1085–1090

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