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JOURNALS // Uspekhi Khimii // Archive

Usp. Khim., 1992 Volume 61, Issue 2, Pages 356–383 (Mi rcr1010)

This article is cited in 36 papers

X-Ray diffraction study of carriers and deposited metallic catalysts

E. M. Moroz

Institute of Catalysis SB RAS, Novosibirsk

Abstract: The possibilities of applying some X-ray diffraction methods in the study of multicomponent highly disperse systems are examined. Such methods include the method based on the radial distribution of atoms (RDA), full-profile X-ray diffraction analysis (FPA), and the method involving the determination of substructural characteristics (MDSC). Examples of the determination of the structural and substructural characteristics of the most important catalyst carriers as well as deposited and non-deposited metallic catalysts are presented. The bibliography includes 129 references.

UDC: 66.097+548.734+539.26

DOI: 10.1070/RC1992v061n02ABEH000940


 English version:
Russian Chemical Reviews, 1992, 61:2, 188–203

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© Steklov Math. Inst. of RAS, 2026