S. A. Belyaev, O. V. Bogdankevich, S. I. Gavrikov, V. G. Dyukov, V. P. Kuklev, L. N. Nevzorova, V. N. Ulasyuk, “Scanning optical microscope based on an electron-beampumped semiconductor laser”, Kvantovaya Elektronika, 1979, Volume 6, Number 7,Pages <nobr>1525

This article is cited in 2 papers

Brief Communications

Scanning optical microscope based on an electron-beampumped semiconductor laser

S. A. Belyaev, O. V. Bogdankevich, S. I. Gavrikov, V. G. Dyukov, V. P. Kuklev, L. N. Nevzorova, V. N. Ulasyuk

Abstract: A scanning optical microscope, based on a kamebax electron-probe unit, is described. The laser beam is scanned by deflection of the electron probe. The laser is made of a cadmium sulfide single crystal. The microscope can produce images in reflected, transmitted, or scattered light at various scanning rates, including those used in television. The resolution is estimated to be 1 μ. A magnification of 100–1000 can be covered without a change of the objective. Induced-current operation is also possible.

UDC: 159.962

PACS: 07.60.Pb, 42.60.Kg

Received: 22.02.1979