This article is cited in 4 papers

Laser applications and other topics in quantum electronics

The use of phase matching as the null method for scanning bulk deformation fields in semiconductor materials

S. L. Musher, M. F. Stupak, V. S. Syskin

Institute of Automation and Electrometry, Siberian Branch of Russian Academy of Sciences, Novosibirsk

Abstract: A high polarisation sensitivity of the phase matching in nonlinear crystals was utilised in fast scanning of bulk deformation fields in semiconductor substrates and films.

PACS: 62.20.Fe, 42.62.Eh

Received: 01.01.1996

 English version: Quantum Electronics, 1996, 26:8, 743–745

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