RUS  ENG
Full version
JOURNALS // Kvantovaya Elektronika // Archive

Kvantovaya Elektronika, 1998 Volume 25, Number 5, Pages 457–461 (Mi qe1245)

This article is cited in 34 papers

SCATTERING AND REFLECTION OF LASER RADIATION

Phase properties of a surface-plasmon resonance from the viewpoint of sensor applications

V. E. Kochergin, A. A. Beloglazov, M. V. Valeiko, P. I. Nikitin

Prokhorov General Physics Institute of the Russian Academy of Sciences, Moscow

Abstract: The physical picture of the behaviour of the phase of a light wave, reflected from a metal film under surface-plasmon resonance conditions, was determined theoretically and experimentally for various values of a whole series of parameters. It was found in particular that for a p-polarised wave the dependence of the phase on the angle of incidence and on the radiation wavelength, and also on the refractive index of a medium or on the thickness of a (bio)chemical receptor layer on the metal surface, had a section with an abrupt jump-like change. The steepness of this section, i.e. the sensitivity of the phase to a change in the relevant parameter, can exceed by several orders of magnitude the steepness of the intensity resonance profile and in theory it can tend to infinity as the intensity at the reflection minimum approaches zero. This is the basis of a discussion of promising (bio)chemical sensor methods ensuring a significantly higher sensitivity and yet the same wide dynamic range as the traditional detection of an intensity minimum.

PACS: 73.20.Mf, 07.07.Df, 42.79.Yd

Received: 26.12.1997


 English version:
Quantum Electronics, 1998, 28:5, 444–448

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2026