This article is cited in 2 papers

Diffraction method for measuring the refractive index on the surface of a material

A. A. Zlenko, V. N. Sorokovikov, V. A. Sychugov, G. P. Shipulo


Abstract: A method for the determination of the refractive index of the surface layer of a matenal, about 5.0–10.0 nm thick, was developed and tested experimentally. The method was used to find the refractive index profile of thin-film waveguides prepared by diffusion in glass.

UDC: 621.372.8.09

PACS: 07.60.Hv, 42.80.Lt

Received: 05.07.1977

 English version: Soviet Journal of Quantum Electronics, 1978, 8:6, 751–754