RUS  ENG
Full version
JOURNALS // Prikladnaya Mekhanika i Tekhnicheskaya Fizika // Archive

Prikl. Mekh. Tekh. Fiz., 2004 Volume 45, Issue 3, Pages 176–180 (Mi pmtf2391)

This article is cited in 5 papers

Photoelastic method for analyzing residual stresses in compact disks

S. I. Gerasimov

Siberian State University of Communication, Novosibirsk, 630049

Abstract: The issues of size and shape stability are especially important in modern high technologies, in particular, in the compact disk technology. Stability in this case is substantially affected by residual stresses that occur in disks because of the imperfection of their production process. The objective of the present study was to develop a simple optical method to estimate the stress state of compact disks.

Keywords: residual stresses, relaxation, photoelasticity.

UDC: 620.171.5

Received: 14.01.2003
Accepted: 28.07.2003


 English version:
Journal of Applied Mechanics and Technical Physics, 2004, 45:3, 453–456

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2026