Change in the rotation speed of the crystal lattice in spherulitic thin films with increasing their thickness

I. P. Pronin^a, E. Yu. Kaptelov^a, S. V. Senkevich^a, M. V. Staritsyn^b, V. P. Pronin^c, S. A. Nemov<sup>d

a</sup> Ioffe Institute, St. Petersburg
^b Prometei Central Research Institute of Structural Materials, St. Petersburg
^c Herzen State Pedagogical University of Russia, St. Petersburg
^d Peter the Great St. Petersburg Polytechnic University

Abstract: The thickness dependence of the lattice rotation rate (gradient) in submicron spherulitic films of lead zirconate titanate (PZT) was studied using the electron backscatter diffraction method. Analysis of the lattice rotation rate dependence on the thickness showed that a decrease in the PZT layer thickness leads to the appearance of plastic deformation; the mechanisms of its formation are discussed.

Keywords: spherulitic microstructure, lead zirconate titanate thin films, rotational crystals, electron backscatter diffraction.

Received: 04.09.2025
Revised: 02.10.2025
Accepted: 02.10.2025

DOI: 10.61011/PJTF.2026.03.62181.20491

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