This article is cited in 1 paper

Stability of electric characteristics of Au films on Si(111)5.55 $\times$ 5.55–Cu surface exposed to oxygen

D. A. Tsukanov^ab, L. V. Bondarenko^ab, E. A. Borisenko<sup>ab

a</sup> Institute for Automation and Control Processes, Far Eastern Branch of the Russian Academy of Sciences, Vladivostok
^b Far Eastern National University, Vladivostok

Abstract: Dependence of the surface electric conductivity of the layered Au/Si(111)5.55 $\times$ 5.55–Cu structure on the thickness of Au film and exposure in oxygen has been studied using low-energy electron diffraction, Auger electron spectroscopy, and four-point-probe conductivity measurements. The samples were obtained by depositing Au (1–5 monolayers, ML) in vacuum at room temperature onto preliminary prepared Si(111)5.55 $\times$ 5.55–Cu surface, after which the structure was kept in oxygen (to a total exposure varied within 0–14000 L) at room temperature. It is established that the increasing oxygen exposure of both the initial and Si(111)5.55 $\times$ 5.55–Cu surface and that coated with gold to 1–3 ML leads to a significant decrease in the surface conductivity of samples. In contrast, the conductivity of samples coated with more than 3 ML of gold remains almost unchanged, which is explained by the fact that a continuous Au film is formed in this case on the Si(111)5.55 $\times$ 5.55–Cu surface.

Received: 27.04.2010

 English version: Technical Physics Letters, 2010, 36:10, 875–877

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