RUS  ENG
Full version
JOURNALS // Pisma v Zhurnal Tekhnicheskoi Fiziki // Archive

Pisma v Zhurnal Tekhnicheskoi Fiziki, 2011 Volume 37, Issue 18, Pages 1–6 (Mi pjtf9272)

This article is cited in 2 papers

Broadband dielectric response of amorphous arsenic triselenide layers grown by different methods

R. A. Castro, G. I. Grabko, T. V. Taturevich

Herzen State Pedagogical University of Russia, St. Petersburg

Abstract: The polarization processes in arsenic triselenide (As$_2$Se$_3$) films grown by thermal vacuum deposition and high-frequency ion plasma sputter methods have been studied in alternating electric field at frequencies in a range of 10$^{-2}$ to 10$^7$ Hz and temperatures of 253–343 K. It has been established that the method of preparation significantly influences the dielectric response of samples, which is related to specific features of the localized energy states.

Received: 04.02.2011


 English version:
Technical Physics Letters, 2011, 37:9, 842–844

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2026