This article is cited in 1 paper

Ion source with magnetic field for time-of-flight mass spectrometry

V. I. Karataev, N. N. Aruev

Ioffe Institute, St. Petersburg

Abstract: A new ion source for the time-of-flight mass spectrometer (TOFMS) with electron-impact ionization and built-in permanent magnet for electron-beam focusing is described. The focusing of electrons in a homogeneous field leads to an increase in the resolving power and sensitivity of the TOFMS. A spectrometer with the proposed source can operate at electron energies within the 7–100-eV range. The method of suppressing spurious lines in the mass spectrum is described, which is based on a decrease in the energy of ionizing electrons.

Received: 24.10.2011
Accepted: 01.03.2011

 English version: Technical Physics Letters, 2011, 37:6, 575–578

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