Abstract:
The surface circular photogalvanic effect (CPGE) at a laser wavelength of 1064 nm was observed for the first time in silver-palladium resistors fabricated by a thick-film technology. The CPGE response was detected using the electrodes oriented parallel to the radiation incidence plane, for the laser beam obliquely incident onto the sample surface. The coefficient of the pulsed laser radiation power conversion into light-induced emf (with the polarity depending on the sign of the circular polarization) amounted to about 80 mV/MW for film dimensions of 0.02 $\times$ 20 $\times$ 20 mm and a load resistance of 50 $\Omega$. The maximum absolute value of the conversion coefficient was observed for the angles of light incidence of $\pm$ 60$^\circ$.
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