This article is cited in 2 papers

A new approach to understanding the mechanisms of diffraction imaging of dislocations in X-ray topography

E. V. Suvorov, I. A. Smirnova

Osipyan Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow region

Abstract: Regularities in the formation of diffraction imaging of dislocations are studied by numerical modeling and experimental section X-ray topography. The study of X-ray scattering by irregularities of the crystal lattice is of interest for several reasons. First, the contrast of defects is connected with the fundamental problem of development of a dynamic theory of X-ray scattering in real crystals. Second, knowledge of the special features of diffraction makes possible a qualitative and, in some cases, quantitative analysis of the X-ray diffraction contrast of defects in a crystal lattice (measurements of the deformation, determination of the sign and parameters of the Burgers vector, etc.).

Received: 09.07.2012

 English version: Technical Physics Letters, 2012, 38:11, 991–994

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