Abstract:
A light-emitting diode (LED) structure based on group III nitride has been grown for the first time on Si(111) substrate with SiC buffer nanolayer (50- to 200-nm-thick) obtained by solid-phase epitaxy. This LED structure is characterized by record low ($<$ 10$^8$ cm$^{-2}$) density of lattice misfit dislocations at a total dislocation density of $\sim$8 $\times$ 10$^8$ cm$^{-2}$. The photo- and electroluminescence spectra of obtained structures have been measured.