This article is cited in 3 papers

Composition and submicron structure of chemically deposited Cu$_2$Se–In$_2$Se$_3$ films

V. F. Markov^abc, S. S. Tulenin^abc, L. N. Maskaeva^abc, M. V. Kuznetsov^abc, N. M. Barbin<sup>abc

a</sup> Ural Federal University named after the First President of Russia B. N. Yeltsin, Ekaterinburg
^b Institute of Solid State Chemistry, Urals Branch of the Russian Academy of Sciences, Ekaterinburg
^c Ural Institute of the State Fire Service

Abstract: Films of substitutional solid solutions of the Cu$_2$Se–In$_2$Se$_3$ system containing up to 7.5 at.% In have been obtained by chemical deposition from aqueous media. The composition, structure, and morphology of the films have been studied. Data of X-ray diffraction and X-ray photoelectron spectroscopy showed that copper in the solid solution occurs in a single-valence state (Cu$^+$). The deposited layers possess a globular morphology and are nanostructured.

Received: 07.11.2011

 English version: Technical Physics Letters, 2012, 38:3, 290–293

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