This article is cited in 1 paper

Effect of annealing in external magnetic field on the microstructure and magnetic properties of FePt films

A. S. Kamzin^a, F. L. Wei^b, B. Mа^c, V. Ganeev^d, L. D. Zaripova<sup>d

a</sup> Ioffe Institute, St. Petersburg
^b Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Research Institute of Magnetic Materials, Lanzhou University, Lanzhou 730000, China
^c State Key Laboratory for Advanced Photonic Materials and Devices, Department of Optical Science and Engineering, Fudan University, Shanghai 200433, China
^d Kazan (Volga Region) Federal University

Abstract: We have studied the influence of annealing in an external magnetic field on the microstructure and magnetic properties of a multilayer Si/Fe(2 nm)/Fe$_{50}$Pt$_{50}$(20 nm)/Pt(2 nm) structure synthesized by means of sequential RF magnetron sputtering of the components. The magnetic field was oriented perpendicular to layers of the structure. It is established that annealing in the external magnetic field leads to the formation of predominant (001) texture in the multilayer structure with $L1_0$-FePt phase. Thus, a method of obtaining multilayer structures based on FePt films required for the perpendicular magnetic recording has been developed.

Received: 04.10.2011

 English version: Technical Physics Letters, 2012, 38:2, 181–184

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