Abstract:
Method for fabrication of self-assembled Ge hut wires on Si(001) by molecular beam epitaxy is proposed. The approach is based on deposition of different amounts of Ge in two zones of a Si substrate and control of the surface morphology of one of the zones by reflection high-energy electron diffraction. It allows the deposition of a certain amount of Ge being arbitrarily close to the critical thickness of pseudomorphic growth in the second zone. Along with the optimized parameters of post-growth annealing, this allowed forming Ge hut wires with different parameters. Ge wires longer than 0.5 $\mu$m with low surface density were obtained, which are suitable for fabrication of hole spin qubits.
Keywords:SiGe heterostructures, molecular beam epitaxy, self-assembled islands, Ge hut wires.