This article is cited in 1 paper

Features of the magnetic properties of Co/Si/Co thin-film systems

E. E. Shalygina^ab, A. M. Kharlamova^ab, A. A. Rozhnovskaya^ab, G. V. Kurlyandskaya^ab, A. V. Svalov<sup>ab

a</sup> Lomonosov Moscow State University
^b Ural Federal University, Yekaterinburg, 620002, Russia

Abstract: The magnetic properties of Co/Si/Co thin-film structures grown by magnetron sputtering have been studied using magnetooptical techniques. It is established that the saturation field $(H_S)$ of trilayers exhibits oscillations as a function of the thickness of the semiconductor (silicon) interlayer. This behavior is explained by structural features of the Co/Si/Co system and the presence of antiferromagnetic exchange coupling between magnetic layers via the silicon interlayer.

Received: 27.06.2013

 English version: Technical Physics Letters, 2013, 39:12, 1089–1092

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