This article is cited in 22 papers

On advantages of X-ray schemes with orthogonal diffraction vectors for studying the structural state of ion-plasma coatings

O. V. Sobol'^ab, O. A. Shovkoplyas<sup>ab

a</sup> Khar'kov Polytechnical University
^b Sumy State University

Abstract: Two complementary X-ray diffraction schemes with orthogonal diffraction vectors are proposed to study the structural state of ion-plasma coatings of the quasi-binary Ti-W-B system: one with a diffraction vector oriented parallel to the normal to the coating surface and the other with a diffraction vector oriented perpendicular to the coating normal (i.e., parallel to the growth surface plane). This technique made it possible to reveal and investigate the anisometry of crystallites at different temperatures and thicknesses of the layer formed, as well as to analyze the strained state. Models are proposed to describe the revealed regularities of crystallite growth.

Received: 14.01.2013

 English version: Technical Physics Letters, 2013, 39:6, 536–539

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