This article is cited in 3 papers

Electron diffraction measurement of the binding rigidity of free-standing graphene

D. A. Kirilenko<sup>ab

a</sup> Ioffe Institute, St. Petersburg
^b University of Antwerp, BE-2020 Antwerpen, Belgium

Abstract: A method for measuring the binding rigidity of free-standing graphene from the dependence of the short-wavelength spectral range of transverse structural fluctuations of a crystal is proposed. The fluctuation spectrum is measured according to the variation in electron-diffraction patterns derived in a transmission electron microscope while tilting the sample.

Received: 11.11.2012

 English version: Technical Physics Letters, 2013, 39:4, 325–328

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