Abstract:
An original method of experimental determination of evaporating electric field strength $F_{ev}$ for field ion emitters is described. The proposed method is universal and can be used for any emitters, including nanodimensional protrusions grown on the surface of field ion emitters in order to increase the localization of emission. Examples of $F_{ev}$ determination for ion emitters made of some metals are given and possible restrictions of the method are analyzed.
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