Abstract:
Results of studies of the thermoluminescence (TL) of anion-deficient alumina $(\alpha$-Al$_2$O$_{3-\delta})$ single crystals and based on them TLD-500 detectors exposed to pulsed X-ray and electron radiation in a wide range of doses $D$, pulsed dose rates $P_p$, and temperatures are described. The TL responses of $\alpha$-Al$_2$O$_{3-\delta}$ for continuous and pulsed X-ray irradiation at $D$ = 0.05–150 Gy are compared. Unlike continuous irradiation, in the case of pulsed irradiation at $P_p\ge 6 \times 10^6$ Gy/s, a linear increase in the TL response as a function of $D$ is registered in the main and “chromium” peaks at 450 and 580 K, respectively, with a decrease in the slope of the dose dependence at $D >$ 2 Gy for the peak at 450 K. It is found that high-dose irradiation ($>$ 60 Gy) leads to the formation of a new TL peak at 830 K and the preferential redistribution of the stored light sums into this peak. The dose dependence for the TL peak at 830 K is studied. It is established that it is linear in a super-high dose range of 10$^4$ to 6 $\times$ 10$^6$Gy at $P_P$ = 2.6 $\times$ 10$^{11}$ Gy/s.
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