Abstract:
Carrier removal rate $V_d$ has been determined in three sublimation-grown $p$-type SiC polytypes under irradiation with 0.9-MeV electrons. Known published data are used to compare the values of $V_d$ in silicon carbide at room temperature in relation to the polytype, conductivity type, and fabrication technology. A model that accounts for the difference between the values of $V_d$ is suggested.