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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2014 Volume 40, Issue 15, Pages 45–49 (Mi pjtf8220)

This article is cited in 1 paper

Irradiation of sublimation-grown $p$-SiC with 0.9-MeV electrons

A. A. Lebedevab, V. V. Kozlovskyab

a Ioffe Institute, St. Petersburg
b Peter the Great St. Petersburg Polytechnic University

Abstract: Carrier removal rate $V_d$ has been determined in three sublimation-grown $p$-type SiC polytypes under irradiation with 0.9-MeV electrons. Known published data are used to compare the values of $V_d$ in silicon carbide at room temperature in relation to the polytype, conductivity type, and fabrication technology. A model that accounts for the difference between the values of $V_d$ is suggested.

Received: 17.02.2014


 English version:
Technical Physics Letters, 2014, 40:8, 651–652

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