University Academic Division of Nonlinear Optics, Institute of Electrophysics, Ural Division, Russian Academy of Sciences, South Ural State University, Chelyabinsk
Abstract:
A new method of obtaining images with a resolution exceeding the diffraction limit of an optical microscope is proposed and experimentally implemented. The method is based on monitoring the pattern of free motion of microparticles over the sample surface and an analysis of the intensity of light scattered by these particles. In experiment, a threefold increase in the ultimate resolution of a microscope has been achieved.