This article is cited in 1 paper

Modeling the antireflective properties of composite materials based on semiconductor filamentary nanocrystals

L. I. Goray^ab, A. D. Bouravlev^cbde, S. A. Ponyaev<sup>cf

a</sup> Institute for Analytical Instrumentation, Russian Academy of Sciences, St. Petersburg
^b St. Petersburg Academic University-Nanotechnology Research and Education Center, Russian Academy of Sciences, St. Petersburg, 194021, Russia
^c Ioffe Institute, St. Petersburg
^d Saint Petersburg State University
^e St. Petersburg Polytechnic University
^f Mozhaiskiy Space Military Academy, St. Petersburg

Abstract: The feasibility of application of films of composite materials based on semiconductor filamentary nanocrystals (FNCs) to suppress the reflection of electromagnetic radiation in the radiofrequency range is demonstrated for the first time with the use of the effective medium theory (EMT). It is shown that the reflec- tion coefficients of single- and double-layer models may be reduced several-fold and by as much as two orders of magnitude, respectively, in a wide range of parameters. The agreement of the EMT data with the results of rigorous calculations allows one to apply the zeroth-order EMT in the analysis and synthesis of antireflective composite materials based on FNCs.

Received: 04.02.2015

 English version: Technical Physics Letters, 2015, 41:7, 624–627

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